US Patent Issued to Micron Technology on Sept. 8 for "Memory device health monitoring and dynamic adjustment of device parameters" (California Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,656, issued on Sept. 8, was assigned to Micron Technology Inc. (Boise, Idaho).

"Memory device health monitoring and dynamic adjustment of device parameters" was invented by Dongxiang Liao (Cupertino, Calif.) and Tomer Tzvi Eliash (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for monitoring health of a die in a memory device and dynamically adjusting a device parameter. The method includes receiving a request for performing a memory access operation on a first data unit of a memory device, and determining a value of a media state metric of the first data unit. The method further includes modifying a device parameter of th...