US Patent Issued to Micron Technology on Oct. 6 for "Artificial intelligence enabled distance event detection using image analysis" (Malaysian Inventors)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,542, issued on Oct. 6, was assigned to Micron Technology Inc. (Boise, Idaho).

"Artificial intelligence enabled distance event detection using image analysis" was invented by Yen-Ee New (Muar, Malaysia) and Yih Fen Tan (Ledang, Malaysia).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some implementations, an image processing system may obtain, from one or more cameras, a stream of image frames. The image processing system may detect, using an object detection model, one or more objects depicted in one or more image frames included in the stream of image frames. The image processing system may generate one or more modified images, of the one or more ...