US Patent Issued to Micron Technology on Oct. 27 for "Cross-temperature measurement of a memory system" (American, German Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,388, issued on Oct. 27, was assigned to Micron Technology Inc. (Boise, Idaho).

"Cross-temperature measurement of a memory system" was invented by Zheng Wang (Louisville, Colo.) and Zoltan Szubbocsev (Unterschleissheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for cross-temperature measurement of a memory system are described. A memory system may record cross-temperature measurements during operation. For example, the memory system may record, at a first time, a temperature of data stored at the memory system and may compare the recorded temperature at the first time with a write temperature of the data tha...