US Patent Issued to Micron Technology on Oct. 20 for "Measurement of representative charge loss in a block to determine charge loss state" (California, Colorado Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,769,470, issued on Oct. 20, was assigned to Micron Technology Inc. (Boise, Idaho).

"Measurement of representative charge loss in a block to determine charge loss state" was invented by Patrick R. Khayat (San Diego), Steven Michael Kientz (Westminster, Colo.), Sivagnanam Parthasarathy (Carlsbad, Calif.), Mustafa N. Kaynak (San Diego) and Vamsi Pavan Rayaprolu (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processing device in a memory sub-system detects an occurrence of a triggering event, determines respective levels of charge loss associated with a first representative wordline of a block of a memory device and with a second represe...