US Patent Issued to Micron Technology on Oct. 20 for "Logic-based defective memory component screening" (Singaporean, American Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,711, issued on Oct. 20, was assigned to Micron Technology Inc. (Boise, Idaho).

"Logic-based defective memory component screening" was invented by Zimu Guo (Milpitas, Calif.), Wei Wang (Fremont, Calif.), Jiangli Zhu (San Jose, Calif.), Selvy Octavia (Singapore) and Heng Yie Chan (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "Exemplary methods, apparatuses, and systems include logic-based defective memory component screening. A defectivity manager reads a defective byte map of memory having separately accessible chunks of memory. Each chunk of memory has a number of bytes addressable in a physical and logical domain. Each chunk of the memor...