US Patent Issued to Micron Technology on May 5 for "Differential strobe fault identification" (Idaho, Minnesota Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,452, issued on May 5, was assigned to Micron Technology Inc. (Boise, Idaho).

"Differential strobe fault identification" was invented by Scott E. Schaefer (Boise, Idaho) and Paul A. Laberge (Shoreview, Minn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for differential strobe fault indication are described. A memory device may be configured to indicate a fault using a read strobe signal. The read strobe signal may be a read data strobe (RDQS) signal, such as a true RDQS (RDQS_t) signal or a complement RDQS (RDQS_c) signal. In some examples, the memory device may indicate the fault based on a characteristic of the read st...