US Patent Issued to Micron Technology on May 26 for "Temperature-based read error handler for memory system" (Singaporean, American Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,982, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho).

"Temperature-based read error handler for memory system" was invented by Srinivasa Reddy Kunduru (Singapore), Lei Zhang (Singapore) and John Maroney (Irvine, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments provide for temperature-based read error handling on the memory system. In particular, some embodiments enable a memory system to handle an uncorrectable error for a read operation with respect to a memory device (of the memory system) based on a cross temperature associated with the read operation."

The patent was filed on Dec. 19, 2024, under ...