US Patent Issued to Micron Technology on May 12 for "Semiconductor memory device-directed error check and scrub" (Idaho Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,766, issued on May 12, was assigned to Micron Technology Inc. (Boise, Idaho).

"Semiconductor memory device-directed error check and scrub" was invented by Sujeet Ayyapureddi (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and apparatuses for a memory device (e.g., DRAM) including a directed error check and scrub (ECS) procedure are described. The directed ECS procedure may include read-modify-write cycles when errors are detected in code words. In some embodiments, the memory device may perform the directed ECS procedure on a code word in which an error was previously detected (for example, in response to a read command...