ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,640, issued on May 12, was assigned to Micron Technology Inc. (Boise, Idaho).
"Operating memory die based on temperature data" was invented by Poorna Kale (Folsom, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for operating memory die based on temperature data are described. A memory system may include a set of temperature sensors each corresponding to one of a set of memory dies. A controller at the memory system may receive, from the set of temperature sensors, temperatures measured at the set of memory dies. Then the controller may identify that an operation of a first memory die is associated with an increase...