ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,205, issued on March 3, was assigned to Micron Technology Inc. (Boise, Idaho).
"Capacitor test" was invented by Marco Redaelli (Munich).
According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations described herein relate to a capacitor test. In some implementations, a system may include a memory device, one or more capacitors located externally to the memory device, and one or more components configured to initiate a capacitor test for the one or more capacitors. The one or more components may be configured to perform an iteration of the capacitor test for the one or more capacitors, wherein performing the iteration of the capacitor test comprises ...