US Patent Issued to Micron Technology on March 24 for "Balancing wear across multiple reclaim groups" (American, Chinese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,585,389, issued on March 24, was assigned to Micron Technology Inc. (Boise, Idaho).

"Balancing wear across multiple reclaim groups" was invented by Daniel J. Hubbard (Boise, Idaho) and Meng Wei (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the present disclosure configure a memory sub-system controller to balance program-erase count (PEC) across multiple reclaim groups of a memory sub-system. The controller groups a set of memory components into a plurality of reclaim groups (RGs), each RG of the plurality of RGs comprising a subset of reclaim units (RUs). The controller receives a request to program a set of data into a first RG ...