US Patent Issued to Micron Technology on June 9 for "Data characteristic-based error correction systems and methods" (California, Washington Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,899, issued on June 9, was assigned to Micron Technology Inc. (Boise, Idaho).

"Data characteristic-based error correction systems and methods" was invented by Fa-Long Luo (San Jose, Calif.) and Jaime Cummins (Bainbridge Island, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatuses and methods for error correction based on data characteristics are disclosed. Data characteristics can include importance of the data. Data is received at a memory controller from a host device, and a characteristic of the received data is determined. A level of error correction is selected from a plurality of error correction levels for the received data based o...