ALEXANDRIA, Va., July 16 -- United States Patent no. 12,672,545, issued on June 30, was assigned to Micron Technology Inc. (Boise, Idaho).
"Apparatuses and methods including structures in scribe regions of semiconductor devices" was invented by Fumie Uchida (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes a scribe region between a first die and a second die adjacent to each other in a first direction, the scribe region including a first crack stop region and a second crack stop region extending in a second direction that is perpendicular to the first direction, wherein the first and second dies are to be separated along a scribe line between the first and second crack stop r...