US Patent Issued to Micron Technology on June 30 for "Abnormal program sequence detection" (Taiwanese, Singaporean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,066, issued on June 30, was assigned to Micron Technology Inc. (Boise, Idaho).

"Abnormal program sequence detection" was invented by Yi Lin Lai (New Tai, Taiwan), Jen Hung Liao (Zhubei City, Taiwan), Wai Leong Chin (Singapore), Pin Hsueh Lai (New Taipei City, Taiwan) and Edric Goh (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for detecting abnormal program sequences on a memory device. In some examples, a timing process is initiated by either starting a timer or recording an initial timer value from the timer. A status register of the memory device is checked in response to initiating the timing process to determine w...