US Patent Issued to Micron Technology on June 23 for "Optimization of soft bit windows based on signal and noise characteristics of memory cells" (California Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,022, issued on June 23, was assigned to Micron Technology Inc. (Boise, Idaho).

"Optimization of soft bit windows based on signal and noise characteristics of memory cells" was invented by James Fitzpatrick (Laguna Niguel, Calif.), Sivagnanam Parthasarathy (Carlsbad, Calif.), Patrick Robert Khayat (San Diego) and Abdelhakim S. Alhussien (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory device to determine a voltage window to read soft bit data. For example, in response to a read command, the memory device can read a group of memory cells at a plurality of test voltages to determine signal and noise characteristics, which can b...