US Patent Issued to Micron Technology on June 23 for "Bin-based read error handling flows using a fast corrective read operation" (California Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,046, issued on June 23, was assigned to Micron Technology Inc. (Boise, Idaho).

"Bin-based read error handling flows using a fast corrective read operation" was invented by Yu-Chung Lien (San Jose, Calif.), Zhenming Zhou (San Jose, Calif.) and Jun Wan (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system comprises a memory device and a processing device, operatively coupled with the memory device. The processing device detects an error during a read operation on a set of target cells of the memory device. The processing device selects, based on a state information bin with which the set of target cells is associated, a read error ...