US Patent Issued to Micron Technology on June 2 for "Read margin health evaluations for memory systems" (Singaporean, Taiwanese Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,646,553, issued on June 2, was assigned to Micron Technology Inc. (Boise, Idaho).

"Read margin health evaluations for memory systems" was invented by Yee Yang Tay (Singapore), Chia Yu Kuo (Hukou, Taiwan) and Tjiu Karuna Bakti Sudarsono (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for read margin health evaluations for memory systems are described. A memory system may evaluate a read margin health for a set of memory cells (e.g., a page of memory cells, a block of memory cells) based on quantities of memory cells that activate in response to applying voltages to the set of memory cells. For example, the memory sy...