US Patent Issued to Micron Technology on July 21 for "Scheduling scan operations in memory sub-systems" (Singaporean, American, Chinese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,902, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho).

"Scheduling scan operations in memory sub-systems" was invented by Yang Liu (San Jose, Calif.), Zhenlei Shen (Milpitas, Calif.), Aaron Lee (Sunnyvale, Calif.), Yue Wei (Shanghai), Xiaoxin Zou (Singapore) and Woei Chen Peh (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "For each voltage offset bin of a plurality of voltage offset bins, a corresponding period of scan operations of memory blocks associated with the voltage offset bin is determined. For each voltage offset bin of the plurality of voltage offset bins, a corresponding scheduling time offset of scan op...