US Patent Issued to Micron Technology on July 21 for "Probablistically determining memory portions for select gate scanning" (California, Idaho Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,087, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho).

"Probablistically determining memory portions for select gate scanning" was invented by Luis Iam (San Jose, Calif.), Zhengang Chen (San Jose, Calif.), Tawalin Opastrakoon (Boise, Idaho), Fanqi Wu (Sunnyvale, Calif.), Juane Li (San Jose, Calif.), Aaron Lee (Sunnyvale, Calif.) and Lei Lin (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and apparatuses include probabilistically determining a read operation number using a window size. A read command is received from a host device by a memory subsystem. A memory address is determined using the...