US Patent Issued to Micron Technology on July 21 for "Bad block mapping based on bad block distribution in a memory sub-system" (Chinese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,977, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho).

"Bad block mapping based on bad block distribution in a memory sub-system" was invented by Dahai Tian (Shanghai) and Jiankun Li (Guangdong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a memory device having a plurality of memory dies and a processing device operatively coupled with the memory device. The processing device is to perform operations including identifying a first logical block stripe of the memory device. The first logical block stripe includes a first plurality of blocks of the memory device. The operations further include determin...