US Patent Issued to Micron Technology on July 14 for "Self-calibration in a memory device" (Idaho, Pennsylvania Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,978, issued on July 14, was assigned to Micron Technology Inc. (Boise, Idaho).

"Self-calibration in a memory device" was invented by Jennifer E. Taylor (Boise, Idaho), Eric J. Stave (Meridian, Idaho), Timothy M. Hollis (Meridian, Idaho), Chulkyu Lee (Meridian, Idaho) and Chris Gregory Holub (Bath, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods include receiving data bits at an input pin of a semiconductor device from a host device. The received data is latched in latch circuitries of the semiconductor device that at least partially implements an equalizer to aid in interpreting the received data bits. A first latched bit latc...