US Patent Issued to Micron Technology on July 14 for "Error decoding with iterative parameter updating" (California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,630, issued on July 14, was assigned to Micron Technology Inc. (Boise, Idaho).

"Error decoding with iterative parameter updating" was invented by Mustafa N. Kaynak (San Diego), Mariano Burich (San Diego), Sivagnanam Parthasarathy (Carlsbad, Calif.) and Eyal En Gad (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An error-handling module of a controller determines that a codeword received from a memory device has errors. The error-handing module assigs an initial set of log-likelihood ratios (LLRs) to bits of the codeword based on a column weight (CW) of a low density parity check (LDPC) code. The error-handling module updates the LLRs...