ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,233, issued on Feb. 24, was assigned to Micron Technology Inc. (Boise, Idaho).
"Memory device wear leveling" was invented by Rainer Frank Bonitz (Bruckmuhl, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A controller of a memory device may determine that an endurance parameter associated with a wear leveling pool of a memory of the memory device satisfies a threshold. The wear leveling pool includes a plurality of memory blocks of the memory. The controller may divide, based on determining that the endurance parameter satisfies the threshold, the plurality of memory blocks of the wear leveling pool into a first wear leveling pool subset that...