US Patent Issued to Micron Technology on Aug. 4 for "Apparatus and test element group" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,136, issued on Aug. 4, was assigned to Micron Technology Inc. (Boise, Idaho).

"Apparatus and test element group" was invented by Fumie Uchida (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to one or more embodiments of the disclosure, an apparatus comprising a plurality of active regions on a semiconductor substrate, an active bridge region connecting two active regions among the plurality of active regions, and a plurality of test circuit elements on the active bridge region and the two active regions."

The patent was filed on Feb. 14, 2024, under Application No. 18/441,926.

*For further information, including images, chart...