US Patent Issued to Micron Technology on Aug. 25 for "NAND detect program completion (NDPC) with power off charge loss calibration in a memory sub-system" (California Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,898, issued on Aug. 25, was assigned to Micron Technology Inc. (Boise, Idaho).

"NAND detect program completion (NDPC) with power off charge loss calibration in a memory sub-system" was invented by Peng Zhang (Los Altos, Calif.), Lei Lin (Fremont, Calif.), Zhengang Chen (San Jose, Calif.), Murong Lang (San Jose, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system including a memory device and an operatively coupled processing device to perform operations including: responsive to detecting a power-up event, performing a first read strobe on a first set of a plurality of memory cells addressable by a firs...