US Patent Issued to Micron Technology on Aug. 11 for "Partially good block handling in a memory device" (California Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,130, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho).

"Partially good block handling in a memory device" was invented by Yu-Chung Lien (San Jose, Calif.), Jiangli Zhu (San Jose, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A programming failure is detected at a block of a memory device. Based on detecting the programming failure, the block is determined to be partially good based on a number of failed bytes in the block. An unfailing portion of the block is identified in response to determining the block is partially good. A record indicating the block is partially good and ident...