ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,401, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho).
"Memory device autonomous measurement attestation" was invented by James Ruane (San Jose, Calif.) and Artsiom Zankovich (Milpitas, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A processing device calculates a set of reference system measurements based on an initial firmware image corresponding to a memory device. The processing device stores the set of reference system measurements in a measurement attestation block of the memory device. A set of current system measurements are calculated by the processing device based on a current firmware image corresponding to...