US Patent Issued to Micron Technology on April 7 for "Program verify compensation in a memory device with a defective deck" (California Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,476, issued on April 7, was assigned to Micron Technology Inc. (Boise, Idaho).

"Program verify compensation in a memory device with a defective deck" was invented by Yu-Chung Lien (San Jose, Calif.), Jun Wan (San Jose, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A request to perform a program operation to program a set of memory cells on a memory device is received. A defect indicator associated with the set of memory cells is determined to satisfy a defect condition. A value of a program verify parameter is determined based on the defect indicator. The program operation is performed using the value of ...