ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,150, issued on April 21, was assigned to Micron Technology Inc. (Boise, Idaho).

"Temperature controlled zone creation and allocation" was invented by Shiva Pahwa (Bangalore, India), Abhilash Ramamurthy Nag (Bangalore, India) and Sathyashankara Bhat Muguli (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Respective temperature values for a plurality of dies of a memory device is obtained. Each respective temperature value is indicative of a temperature at a corresponding die of the plurality of dies of the memory device. The plurality of dies based on the respective temperature values, each die of the plurality of dies is ordered. A ...