ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,276, issued on April 21, was assigned to Micron Technology Inc. (Boise, Idaho).
"Memory fault tolerance using raid" was invented by Tony M. Brewer (Plano, Texas) and Craig Warner (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems, methods, and computer-readable storage devices can include fabric networks for isolating and correcting failures in the fabric network and device failures. The fabric network connects to a group of devices and a host. The group of devices includes at least a target data device, other data devices, and a parity device. A redundant array of independent devices (RAID) engine, which is coupled to the one gro...