US Patent Issued to Micron Technology on April 14 for "Block health detector for block retirement in a memory sub-system" (California, Idaho Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,603,144, issued on April 14, was assigned to Micron Technology Inc. (Boise, Idaho).

"Block health detector for block retirement in a memory sub-system" was invented by Fanqi Wu (Sunnyvale, Calif.), Kevin R. Brandt (Boise, Idaho), Zhenlei Shen (Milpitas, Calif.), Tingjun Xie (Milpitas, Calif.), Yang Liu (San Jose, Calif.) and Jiangli Zhu (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processing device in a memory sub-system identifies a read error associated with a block and initiates a diagnostic memory access operation on the block. The processing device determines whether the diagnostic memory access operation was successfully per...