US Patent Issued to Microchip Technology on March 24 for "Single and dual-edge triggered phase error detection" (Canadian, American Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,587,199, issued on March 24, was assigned to Microchip Technology Inc. (Chandler, Ariz.).

"Single and dual-edge triggered phase error detection" was invented by William Roberts (Highland, Utah), Youcef Fouzar (Ottawa), Waleed El-halwagy (Ottawa) and Kristopher Kshonze (Ottawa).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example apparatus includes a phase detector and a phase error detector. The phase detector may set a status signal to indicate status of phase difference between a reference clock and a feedback clock, the feedback clock generated by a clock tracking circuit to track the reference clock. The phase error detector may set an error si...