US Patent Issued to Microchip Technology on June 30 for "Leakage current noise reduction for ionization chamber based alarms" (Arizona, Pennsylvania Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,775, issued on June 30, was assigned to Microchip Technology Inc. (Chandler, Ariz.).

"Leakage current noise reduction for ionization chamber based alarms" was invented by Arthur Eck (Gilbert, Ariz.), Patrick McFarland (Gilbert, Ariz.) and Jonathan Corbett (Havertown, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "As an example, an apparatus may include: an ionization chamber, a voltage source to drive the ionization chamber; a voltage sensor to measure an ionization chamber output voltage; a calibration circuit to compensate the ionization chamber output voltage based on a correction factor; and a monitoring circuit to trigger an alarm if the co...