ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,966, issued on July 21, was assigned to Microchip Technology Inc. (Chandler, Ariz.).

"Adjusted programming associated with read errors" was invented by Saswati Das (Milpitas, Calif.), Nian Niles Yang (Mountain View, Calif.) and Srinivas Yelisetti (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some implementations, a storage device may perform a read operation using a first read voltage. The storage device may identify a read error associated with the read operation. The storage device may identify a difference between the first read voltage and a second read voltage, the second read voltage associated with a reduced raw bit error...