US Patent Issued to Microchip Technology on Aug. 11 for "Method of detecting over-programming in a solid-state drive" (California, Connecticut Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,976, issued on Aug. 11, was assigned to Microchip Technology Inc. (Chandler, Ariz.).

"Method of detecting over-programming in a solid-state drive" was invented by Nian Niles Yang (Mountain View, Calif.), Pitamber Shukla (San Jose, Calif.) and Ramyakanth Edupuganti (San Jose, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of detecting an over-programming of a memory cell during a write operation in a non-volatile memory media of a solid-state drive, and a solid-state drive with over-programming detection. When data is written to the states of the memory cell, a current last bit is routinely or selectively checked to detect an over-prog...