US Patent Issued to Mettler-Toledo (Changzhou) Measurement Technology, Mettler-Toledo (Changzhou) Precision Instruments, Mettler-Toledo International Trading (Shanghai) on May 26 for "Method for detecting and removing personnel interference while measuring volume of an object" (Chinese Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,639,825, issued on May 26, was assigned to Mettler-Toledo (Changzhou) Measurement Technology Ltd. (Changzhou, China), Mettler-Toledo (Changzhou) Precision Instruments Ltd. (Changzhou, China) and Mettler-Toledo International Trading (Shanghai) Co. Ltd. (Shanghai).

"Method for detecting and removing personnel interference while measuring volume of an object" was invented by Conghan Cao (Changzhou, China), Chao Fang (Changzhou, China), Jindong Cui (Changzhou, China), Shenhui Wang (Changzhou, China), Song Zhang (Changzhou, China) and Hongqing Song (Changzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "These disclosures relate to a method for detect...