US Patent Issued to Mettler-Toledo (Changzhou) Measurement Technology, Mettler-Toledo (Changzhou) Precision Instruments, Mettler-Toledo International Trading (Shanghai) on July 21 for "Volume measurement method and an apparatus based on a depth camera, and a computer-readable medium" (Chinese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,597, issued on July 21, was assigned to Mettler-Toledo (Changzhou) Measurement Technology Ltd. (Changzhou, China), Mettler-Toledo (Changzhou) Precision Instruments Ltd. (Changzhou, China) and Mettler-Toledo International Trading (Shanghai) Co. Ltd. (Shanghai).

"Volume measurement method and an apparatus based on a depth camera, and a computer-readable medium" was invented by Conghan Cao (Changzhou, China), Jiang Yin (Changzhou, China), Song Zhang (Changzhou, China), Chao Fang (Changzhou, China), Hongqing Song (Changzhou, China), Zhenyu Dai (Changzhou, China), Fenping Qian (Changzhou, China), Huanbing Cheng (Changzhou, China) and Shenhui Wang (Changzhou, China).

According to the a...