US Patent Issued to Menlo Microsystems on Aug. 4 for "Probe card design for optimal current distribution" (New York, Massachusetts Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,114, issued on Aug. 4, was assigned to Menlo Microsystems Inc. (Irvine, Calif.).

"Probe card design for optimal current distribution" was invented by Maxwell Connor de Feijter (Menands, N.Y.), Chris Nassar (Hudson, N.Y.), Michael Reilly Comstock (Newtonville, N.Y.) and Xu Zhu (Belmont, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments disclose a micro-electrical-mechanical-system (MEMS) test-circuit structure. The test-circuit structure includes a wafer layer having an electrically conductive trace terminating to a plurality of respective pins at a first end of the electrically conductive trace and terminating to a plurality of connect...