ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,671, issued on April 21, was assigned to MediaTek Inc. (Hsinchu City, Taiwan).

"RF testing method and testing system" was invented by Jung-Yin Chien (Hsinchu, Taiwan), Po-Yen Tseng (Hsinchu, Taiwan), Pin-Lin Huang (Hsinchu, Taiwan) and Wen-Chih Chen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An RF testing method is applied between a testing instrument and multiple devices under test at least including a first DUT and a second DUT. The testing instrument includes a signal generator and a signal analyzer. A sync signal is sent to the testing instrument and the first DUT, so that the first DUT occupies the signal generator to rece...