US Patent Issued to MDAP, NIPRO on Oct. 20 for "Observation device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,769,103, issued on Oct. 20, was assigned to MDAP Co. LTD. (Yamanashi, Japan) and NIPRO Corp. (Osaka, Japan).

"Observation device" was invented by Hidekazu Sato (Chuo, Japan), Toshikazu Hayakawa (Chuo, Japan), Yoshihiro Yoshikawa (Settsu, Japan), Hideaki Yamamoto (Settsu, Japan) and Hisashi Miura (Settsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An observation device configured to observe a sample stored in a multistage container including a plurality of spaces divided by a plurality of partition walls which are parallel. The observation device includes: a light source configured to generate light; a phase contrast microscope configured to ir...