US Patent Issued to MAX-PLANCK-GESELLSCHAFT ZUR FORDERUNG DER WISSENSCHAFTEN E. V. on March 17 for "Workstation, preparation station and method for manipulating an electron microscopy grid assembly" (German Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,580,149, issued on March 17, was assigned to MAX-PLANCK-GESELLSCHAFT ZUR FORDERUNG DER WISSENSCHAFTEN E. V. (Munich).

"Workstation, preparation station and method for manipulating an electron microscopy grid assembly" was invented by Sebastian Tacke (Dortmund, Germany) and Stefan Raunser (Dortmund, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a workstation (1), a preparation station (2) and a method for manipulating an electron microscopy grid assembly (3). The workstation (1) comprises a first compartment (101), a first gas inlet (102) for generating an overpressure in the first compartment (101), a first glove (104)...