US Patent Issued to Materialise on July 14 for "System and methods for calibration of X-ray images" (Belgian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,678,122, issued on July 14, was assigned to Materialise N.V. (Leuven, Belgium).

"System and methods for calibration of X-ray images" was invented by Pieter Slagmolen (Leuven, Belgium), Christophe Van Dijck (Leuven, Belgium), Koen Engelborghs (Leuven, Belgium) and Andy Enefer (Leuven, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "Certain embodiments provide a system for calibrating an X-ray image. The system may receive an X-ray image of an anatomical part of a patient. The system may further receive a 3-D surface scan of a surface of the patient where the anatomical part is located. The system may derive a measurement correction to apply to mea...