US Patent Issued to Marvell Asia on Sept. 1 for "Method and apparatus for silicon photonics testing" (California Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,947, issued on Sept. 1, was assigned to Marvell Asia Pte Ltd (Singapore).

"Method and apparatus for silicon photonics testing" was invented by Andrew Yick (Porter Ranch, Calif.) and Masaki Kato (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A first photonics integrated circuit (PIC) chip originates from a PIC wafer. The first PIC chip includes a substrate, and one or more optical communication components fabricated on the substrate. Optical testing components are also fabricated on the substrate. The optical testing components are configured to, prior to die singulation of the PIC wafer, transfer light to a second PIC chip on the ...