ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,431, issued on Aug. 11, was assigned to Marunaka Co. Ltd. (Aichi, Japan) and TOYOTA JIDOSHA K.K. (Aichi-ken, Japan).
"Apparatus and method for leak test" was invented by Mitsugu Nakagawa (Aichi, Japan) and Kyojiro Inoue (Toyota, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for leak test is provided with: a gas dissolution portion having function to degasify a unused liquid; a liquid filling and circulation portion for filling the gas dissolved liquid in the test piece; a high-pressure application portion for pressurizing the filled gas dissolved liquid; a leak test portion for detecting the gas in the liquid vapor leaking out in...