US Patent Issued to Malvern Panalytical on May 19 for "Identifying charge sharing in X-ray diffraction" (Dutch Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,576, issued on May 19, was assigned to Malvern Panalytical B.V. (Almelo, Netherlands).

"Identifying charge sharing in X-ray diffraction" was invented by Roelof De Vries (Almelo, Netherlands) and Vladimir Jovanovic (Almelo, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray diffraction apparatus and method of processing signals from an X-ray diffraction apparatus are disclosed. By analysing a time delay between first and second pulses, generated by respective first and second detector cells, and by analysing an energy of each of the first pulse and the second pulse, charge sharing events and coincident photon events can be identified....