ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,984, issued on Sept. 8, was assigned to Magnescale Co. Ltd. (Kanagawa, Japan).

"Displacement detecting apparatus" was invented by Hideaki Tamiya (Kanagawa, Japan), Shun Okuyama (Kanagawa, Japan) and Akinori Ebine (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "[Problem] To provide a displacement detection apparatus that offers high measurement accuracy while maintaining high versatility.[Solution] A second birefringent unit 121 and a third birefringent unit 123 are configured to change the phase difference between the first light beam L1 and the second light beam L2 in response to movement of the target T in the measurement direction...