US Patent Issued to Lite-On Technology on Sept. 8 for "Test control device and operating method thereof" (Taiwanese Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,152, issued on Sept. 8, was assigned to Lite-On Technology Corp. (Taipei, Taiwan).

"Test control device and operating method thereof" was invented by Jin-Jye Chou (Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test control device and an operating method thereof are disclosed. The test control device includes a voltage generator and a data processor. The voltage generator is coupled to a device under test which is a universal serial bus interface through a first connector. The voltage generator is configured to generate a supply voltage to the device under test. The data processor receives a test signal sent by an external electroni...