US Patent Issued to Liaoning University on May 19 for "Test device for arbitrarily directional combined loading and method for using the same" (Chinese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,534, issued on May 19, was assigned to Liaoning University (Shenyang City, China).

"Test device for arbitrarily directional combined loading and method for using the same" was invented by Yonghui Xiao (Shenyang City, China), Yishan Pan (Shenyang City, China), Xiangyu Pan (Shenyang City, China), Jianzhuo Zhang (Shenyang City, China), Aiwen Wang (Shenyang City, China) and Lianpeng Dai (Shenyang City, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to the technical field of loading test devices, relating to a test device for arbitrarily directional combined loading and a method for using the loading test device. The d...