ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,293, issued on Nov. 3, was assigned to LG Energy Solution Ltd. (Seoul, South Korea).
"Electrode sheet defect inspection device" was invented by Jong Hwa Lee (Daejeon, South Korea) and Ee Beom Choi (Daejeon, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electrode sheet defect inspection device includes a vision inspection part configured to inspect defects in each tab part during a traveling process of an electrode sheet on which a plurality of tab parts is formed; a marking part configured to print a defective mark on a selected tab part in response to the tab part being determined to be defective, based on inspection information of t...