US Patent Issued to LG Chem on June 30 for "Coating thickness measuring device and coating device including the same" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,323, issued on June 30, was assigned to LG Chem Ltd. (Seoul, South Korea).

"Coating thickness measuring device and coating device including the same" was invented by Do-Hyun Lee (Daejeon, South Korea) and Seung-Heon Lee (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A coating thickness measuring device is configured to measure a thickness of a coating material applied to a substrate which is fed by a coating roll on which the substrate is rolled. The coating thickness measuring device includes a coating thickness measurement module, wherein the coating thickness measurement module includes a light applying unit configured to ap...